TEST_NAME : Wafer
TEST_DATE : 24_09_02-23_32_10
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-015-008-06 | FUSED_ID : 6359364768391819398
  IC_TEMP :  -45.85 | VDDM : 1137.86 | AUX_INT :   -7.52 | CsaBias :   83.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43919e-03 / 2
  ADC_P0  : -7.51636e-03 ± 2.57829e-02
  ADC_P1  : 8.33730e-03 ± 6.46785e-04
  ADC_P2  : -4.98012e-06 ± 3.21355e-06
  CSA_Chi2/NDF : 1.16335e-04 / 2
  CSA_P0  : 5.69266e-02 ± 7.19411e-03
  CSA_P1  : 9.79190e-03 ± 5.42025e-04
  CSA_P2  : -4.26380e-05 ± 8.25439e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [14, 33, 35, 53]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [20, 56, 86, 106, 118, 123, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2538', '1.800', '0.1504', '1.800', '0.0857', '7.000', '0.7078', 1, 1, 1, 1, 1725312730.244668]
VI_after__Init : ['1.201', '0.2538', '1.800', '0.1502', '1.800', '0.0799', '7.000', '0.7075', 1, 1, 1, 1, 1725312738.4720845]
VI_at__the_End : ['1.201', '0.5006', '1.800', '0.1381', '1.804', '0.1085', '7.000', '0.7083', 1, 1, 1, 1, 1725312802.0282574]