TEST_NAME : Wafer
TEST_DATE : 24_09_02-23_27_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-015-011-06 | FUSED_ID : 6359364768391819446
  IC_TEMP :  -52.68 | VDDM : 1125.21 | AUX_INT :   -6.93 | CsaBias :   68.31
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.56663e-04 / 2
  ADC_P0  : -6.93136e-03 ± 2.09717e-02
  ADC_P1  : 8.40622e-03 ± 5.29575e-04
  ADC_P2  : -5.11211e-06 ± 2.65090e-06
  CSA_Chi2/NDF : 1.27292e-04 / 2
  CSA_P0  : 6.04141e-02 ± 7.52529e-03
  CSA_P1  : 1.01689e-02 ± 5.66976e-04
  CSA_P2  : -5.03538e-05 ± 8.63437e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [6, 43, 89, 94]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [52, 60, 94, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4419', '1.800', '0.1504', '1.799', '0.0975', '7.000', '0.7076', 1, 1, 1, 1, 1725312447.7289977]
VI_after__Init : ['1.202', '0.4421', '1.800', '0.1505', '1.801', '0.0917', '7.000', '0.7076', 1, 1, 1, 1, 1725312455.9304028]
VI_at__the_End : ['1.201', '0.4971', '1.800', '0.1402', '1.805', '0.1124', '7.000', '0.7083', 1, 1, 1, 1, 1725312516.0229006]