TEST_NAME : Wafer
TEST_DATE : 24_09_02-23_25_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-015-012-06 | FUSED_ID : 6359364768391819462
  IC_TEMP :  -51.62 | VDDM : 1132.04 | AUX_INT :   -7.94 | CsaBias :   83.16
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18959e-03 / 2
  ADC_P0  : -7.93568e-03 ± 2.33950e-02
  ADC_P1  : 8.33857e-03 ± 5.80486e-04
  ADC_P2  : -5.22574e-06 ± 2.86012e-06
  CSA_Chi2/NDF : 1.54778e-04 / 2
  CSA_P0  : 6.12000e-02 ± 8.29808e-03
  CSA_P1  : 1.03477e-02 ± 6.25200e-04
  CSA_P2  : -5.09978e-05 ± 9.52106e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [2, 8, 49, 59, 75, 94, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [9, 63, 77, 85, 89, 107, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4180', '1.800', '0.1646', '1.800', '0.0913', '7.000', '0.7076', 1, 1, 1, 1, 1725312351.4262764]
VI_after__Init : ['1.201', '0.4183', '1.800', '0.1646', '1.801', '0.0856', '7.000', '0.7075', 1, 1, 1, 1, 1725312360.3316438]
VI_at__the_End : ['1.201', '0.5062', '1.800', '0.1413', '1.805', '0.1124', '7.000', '0.7084', 1, 1, 1, 1, 1725312423.9887638]