TEST_NAME : Wafer
TEST_DATE : 24_09_02-23_19_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-015-016-01 | FUSED_ID : 6359364768391819521
  IC_TEMP :  -51.69 | VDDM : 1130.47 | AUX_INT :   -6.57 | CsaBias :   89.79
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.33567e-04 / 2
  ADC_P0  : -6.56834e-03 ± 2.07113e-02
  ADC_P1  : 8.08851e-03 ± 5.02775e-04
  ADC_P2  : -4.85662e-06 ± 2.41418e-06
  CSA_Chi2/NDF : 8.63834e-05 / 2
  CSA_P0  : 6.12161e-02 ± 6.19923e-03
  CSA_P1  : 9.80492e-03 ± 4.67067e-04
  CSA_P2  : -4.42291e-05 ± 7.11288e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [24, 71, 72, 74]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [15, 91]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.1866', '1.800', '0.1658', '1.800', '0.0880', '7.000', '0.7073', 1, 1, 1, 1, 1725311966.4950655]
VI_after__Init : ['1.201', '0.1867', '1.800', '0.1655', '1.800', '0.0826', '7.000', '0.7074', 1, 1, 1, 1, 1725311975.347378]
VI_at__the_End : ['1.201', '0.5009', '1.800', '0.1349', '1.800', '0.1100', '7.000', '0.7079', 1, 1, 1, 1, 1725312035.9409509]