TEST_NAME : Wafer
TEST_DATE : 24_09_02-23_11_24
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-015-021-01 | FUSED_ID : 6359364768391819601
  IC_TEMP :  -48.40 | VDDM : 1122.36 | AUX_INT :   -7.13 | CsaBias :   81.72
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.73042e-04 / 2
  ADC_P0  : -7.12546e-03 ± 2.11290e-02
  ADC_P1  : 8.13439e-03 ± 5.10198e-04
  ADC_P2  : -5.19509e-06 ± 2.43873e-06
  CSA_Chi2/NDF : 8.83328e-05 / 2
  CSA_P0  : 5.76381e-02 ± 6.26879e-03
  CSA_P1  : 9.33422e-03 ± 4.72308e-04
  CSA_P2  : -3.82936e-05 ± 7.19269e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [30, 46, 62, 74, 87, 94, 106, 111, 113, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [65, 97, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2566', '1.800', '0.1466', '1.800', '0.0855', '7.000', '0.7068', 1, 1, 1, 1, 1725311483.940961]
VI_after__Init : ['1.202', '0.2565', '1.800', '0.1466', '1.800', '0.0802', '7.000', '0.7067', 1, 1, 1, 1, 1725311492.8353853]
VI_at__the_End : ['1.201', '0.4909', '1.800', '0.1372', '1.801', '0.1102', '7.000', '0.7077', 1, 1, 1, 1, 1725311559.1346061]