TEST_NAME : Wafer
TEST_DATE : 24_09_02-23_09_48
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-015-022-01 | FUSED_ID : 6359364768391819617
  IC_TEMP :  -47.97 | VDDM : 1128.05 | AUX_INT :   -7.75 | CsaBias :   79.84
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.11281e-03 / 2
  ADC_P0  : -7.74849e-03 ± 2.26276e-02
  ADC_P1  : 8.01446e-03 ± 5.41849e-04
  ADC_P2  : -4.70317e-06 ± 2.57667e-06
  CSA_Chi2/NDF : 1.08996e-04 / 2
  CSA_P0  : 5.84892e-02 ± 6.96351e-03
  CSA_P1  : 9.70576e-03 ± 5.24650e-04
  CSA_P2  : -4.17665e-05 ± 7.98980e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [20, 37, 79, 82, 99, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [19, 92, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2806', '1.800', '0.1577', '1.800', '0.0920', '7.000', '0.7069', 1, 1, 1, 1, 1725311387.610207]
VI_after__Init : ['1.202', '0.2806', '1.800', '0.1578', '1.800', '0.0863', '7.000', '0.7066', 1, 1, 1, 1, 1725311396.3494034]
VI_at__the_End : ['1.202', '0.5005', '1.800', '0.1361', '1.800', '0.1093', '7.000', '0.7076', 1, 1, 1, 1, 1725311458.2148232]