TEST_NAME : Wafer
TEST_DATE : 24_09_02-23_08_11
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-015-023-01 | FUSED_ID : 6359364768391819633
  IC_TEMP :  -43.84 | VDDM : 1130.55 | AUX_INT :   -5.66 | CsaBias :   80.56
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.33067e-04 / 2
  ADC_P0  : -5.65780e-03 ± 2.07225e-02
  ADC_P1  : 7.88614e-03 ± 4.96547e-04
  ADC_P2  : -4.39838e-06 ± 2.34578e-06
  CSA_Chi2/NDF : 5.87160e-05 / 2
  CSA_P0  : 5.81895e-02 ± 5.11094e-03
  CSA_P1  : 9.20025e-03 ± 3.85072e-04
  CSA_P2  : -3.51764e-05 ± 5.86419e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [2, 8, 29, 34, 44, 52, 77, 109, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [7, 9, 23, 71, 96, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1890', '1.800', '0.1411', '1.800', '0.0857', '7.000', '0.7069', 1, 1, 1, 1, 1725311291.0408325]
VI_after__Init : ['1.202', '0.1890', '1.800', '0.1411', '1.800', '0.0803', '7.000', '0.7065', 1, 1, 1, 1, 1725311299.15102]
VI_at__the_End : ['1.201', '0.4954', '1.800', '0.1342', '1.800', '0.1079', '7.000', '0.7074', 1, 1, 1, 1, 1725311367.4567676]