TEST_NAME : Wafer
TEST_DATE : 24_09_02-23_04_58
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-015-025-01 | FUSED_ID : 6359364768391819665
  IC_TEMP :  -52.27 | VDDM : 1118.52 | AUX_INT :   -6.02 | CsaBias :   75.60
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.14639e-04 / 2
  ADC_P0  : -6.01575e-03 ± 1.93188e-02
  ADC_P1  : 8.21512e-03 ± 4.72967e-04
  ADC_P2  : -5.37424e-06 ± 2.28299e-06
  CSA_Chi2/NDF : 1.02260e-04 / 2
  CSA_P0  : 5.66613e-02 ± 6.74490e-03
  CSA_P1  : 9.20406e-03 ± 5.08180e-04
  CSA_P2  : -3.64031e-05 ± 7.73897e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [8, 18, 32, 54, 64, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [7, 56, 83, 121, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1953', '1.800', '0.1476', '1.799', '0.0850', '7.000', '0.7069', 1, 1, 1, 1, 1725311097.377544]
VI_after__Init : ['1.202', '0.1953', '1.800', '0.1475', '1.800', '0.0792', '7.000', '0.7066', 1, 1, 1, 1, 1725311106.1829011]
VI_at__the_End : ['1.201', '0.4867', '1.800', '0.1335', '1.800', '0.1099', '7.000', '0.7075', 1, 1, 1, 1, 1725311165.193339]