TEST_NAME : Wafer
TEST_DATE : 24_09_02-23_41_49
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-016-007-14 | FUSED_ID : 6359364768391823486
  IC_TEMP :  -50.48 | VDDM : 1121.09 | AUX_INT :   -8.56 | CsaBias :   87.79
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36625e-03 / 2
  ADC_P0  : -8.55891e-03 ± 2.50906e-02
  ADC_P1  : 8.08791e-03 ± 6.02820e-04
  ADC_P2  : -4.88673e-06 ± 2.87968e-06
  CSA_Chi2/NDF : 1.56499e-04 / 2
  CSA_P0  : 5.80403e-02 ± 8.34408e-03
  CSA_P1  : 9.47969e-03 ± 6.28666e-04
  CSA_P2  : -4.14897e-05 ± 9.57384e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [45, 46, 70, 93, 103, 106, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [1, 26, 69, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2866', '1.800', '0.1427', '1.800', '0.0855', '7.000', '0.7078', 1, 1, 1, 1, 1725313308.761716]
VI_after__Init : ['1.202', '0.2866', '1.800', '0.1426', '1.800', '0.0801', '7.000', '0.7074', 1, 1, 1, 1, 1725313316.8820705]
VI_at__the_End : ['1.202', '0.4915', '1.800', '0.1365', '1.807', '0.1100', '7.000', '0.7082', 1, 1, 1, 1, 1725313379.4891853]