TEST_NAME : Wafer
TEST_DATE : 24_09_02-23_43_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-016-008-14 | FUSED_ID : 6359364768391823502
  IC_TEMP :  -45.23 | VDDM : 1134.18 | AUX_INT :   -6.44 | CsaBias :   84.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.14675e-04 / 2
  ADC_P0  : -6.44399e-03 ± 2.05220e-02
  ADC_P1  : 8.35993e-03 ± 5.21105e-04
  ADC_P2  : -4.72970e-06 ± 2.62088e-06
  CSA_Chi2/NDF : 8.74739e-05 / 2
  CSA_P0  : 5.95668e-02 ± 6.23823e-03
  CSA_P1  : 9.20763e-03 ± 4.70006e-04
  CSA_P2  : -3.53697e-05 ± 7.15763e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [21, 34, 80, 90, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [10, 37, 44, 55, 60, 73, 92]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3343', '1.800', '0.1647', '1.800', '0.0976', '7.000', '0.7074', 1, 1, 1, 1, 1725313405.9832783]
VI_after__Init : ['1.202', '0.3343', '1.800', '0.1646', '1.801', '0.0918', '7.000', '0.7071', 1, 1, 1, 1, 1725313414.103691]
VI_at__the_End : ['1.202', '0.4955', '1.800', '0.1384', '1.804', '0.1091', '7.000', '0.7083', 1, 1, 1, 1, 1725313476.9889634]