TEST_NAME : Wafer
TEST_DATE : 24_09_02-23_46_38
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-016-010-14 | FUSED_ID : 6359364768391823534
  IC_TEMP :  -50.23 | VDDM : 1125.68 | AUX_INT :   -8.35 | CsaBias :   76.09
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09670e-03 / 2
  ADC_P0  : -8.34714e-03 ± 2.24269e-02
  ADC_P1  : 8.50045e-03 ± 5.61939e-04
  ADC_P2  : -5.66289e-06 ± 2.80222e-06
  CSA_Chi2/NDF : 1.51928e-04 / 2
  CSA_P0  : 6.03450e-02 ± 8.22132e-03
  CSA_P1  : 1.01871e-02 ± 6.19417e-04
  CSA_P2  : -4.80956e-05 ± 9.43299e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [1, 26, 30, 39, 56, 81, 104, 119, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [0, 6, 13, 47, 52, 89, 95]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1643', '1.799', '0.1222', '1.800', '0.0835', '7.000', '0.7082', 1, 1, 1, 1, 1725313598.276159]
VI_after__Init : ['1.202', '0.1643', '1.800', '0.1222', '1.800', '0.0762', '7.000', '0.7072', 1, 1, 1, 1, 1725313606.2564385]
VI_at__the_End : ['1.201', '0.5047', '1.800', '0.1382', '1.800', '0.1101', '7.000', '0.7079', 1, 1, 1, 1, 1725313666.6635144]