TEST_NAME : Wafer
TEST_DATE : 24_09_02-23_49_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-016-012-14 | FUSED_ID : 6359364768391823566
  IC_TEMP :  -51.32 | VDDM : 1125.38 | AUX_INT :   -7.97 | CsaBias :   73.35
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.14079e-03 / 2
  ADC_P0  : -7.96684e-03 ± 2.29018e-02
  ADC_P1  : 8.18195e-03 ± 5.56660e-04
  ADC_P2  : -5.06180e-06 ± 2.68786e-06
  CSA_Chi2/NDF : 1.05454e-04 / 2
  CSA_P0  : 6.00802e-02 ± 6.84942e-03
  CSA_P1  : 9.71810e-03 ± 5.16054e-04
  CSA_P2  : -4.49462e-05 ± 7.85890e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [22, 54, 84, 89, 115, 118, 120, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [4, 68, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2438', '1.800', '0.1239', '1.800', '0.0859', '7.000', '0.7069', 1, 1, 1, 1, 1725313791.818681]
VI_after__Init : ['1.201', '0.2437', '1.800', '0.1238', '1.800', '0.0803', '7.000', '0.7070', 1, 1, 1, 1, 1725313799.9520159]
VI_at__the_End : ['1.201', '0.4903', '1.800', '0.1367', '1.800', '0.1124', '7.000', '0.7076', 1, 1, 1, 1, 1725313859.6582417]