TEST_NAME : Wafer
TEST_DATE : 24_09_02-23_59_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-016-018-09 | FUSED_ID : 6359364768391823657
  IC_TEMP :  -48.80 | VDDM : 1127.30 | AUX_INT :   -6.51 | CsaBias :   83.25
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.01554e-04 / 2
  ADC_P0  : -6.50827e-03 ± 2.03666e-02
  ADC_P1  : 8.21099e-03 ± 5.06385e-04
  ADC_P2  : -4.65122e-06 ± 2.49493e-06
  CSA_Chi2/NDF : 1.18713e-04 / 2
  CSA_P0  : 6.13419e-02 ± 7.26728e-03
  CSA_P1  : 9.62953e-03 ± 5.47537e-04
  CSA_P2  : -4.11102e-05 ± 8.33834e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [18, 28, 39, 81]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [6, 55, 73, 85, 88, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1620', '1.800', '0.1529', '1.799', '0.0887', '7.000', '0.7067', 1, 1, 1, 1, 1725314363.475922]
VI_after__Init : ['1.202', '0.1619', '1.800', '0.1529', '1.800', '0.0830', '7.000', '0.7068', 1, 1, 1, 1, 1725314371.7342222]
VI_at__the_End : ['1.202', '0.4992', '1.800', '0.1398', '1.800', '0.1099', '7.000', '0.7076', 1, 1, 1, 1, 1725314432.2355843]