TEST_NAME : Wafer
TEST_DATE : 24_09_03-00_18_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-017-016-04 | FUSED_ID : 6359364768391827716
  IC_TEMP :  -48.15 | VDDM : 1136.85 | AUX_INT :   -6.41 | CsaBias :   75.38
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.53087e-04 / 2
  ADC_P0  : -6.41270e-03 ± 2.09342e-02
  ADC_P1  : 8.22908e-03 ± 5.18738e-04
  ADC_P2  : -4.94621e-06 ± 2.54133e-06
  CSA_Chi2/NDF : 1.26598e-04 / 2
  CSA_P0  : 6.23518e-02 ± 7.50474e-03
  CSA_P1  : 9.95445e-03 ± 5.65428e-04
  CSA_P2  : -4.48983e-05 ± 8.61080e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [84, 101, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [41, 47, 52, 79, 80, 83, 93, 100, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2396', '1.800', '0.1824', '1.800', '0.0859', '7.000', '0.7077', 1, 1, 1, 1, 1725315519.219736]
VI_after__Init : ['1.202', '0.2396', '1.800', '0.1824', '1.800', '0.0805', '7.000', '0.7076', 1, 1, 1, 1, 1725315527.9549942]
VI_at__the_End : ['1.201', '0.5095', '1.800', '0.1420', '1.800', '0.1100', '7.000', '0.7084', 1, 1, 1, 1, 1725315586.2734969]