TEST_NAME : Wafer
TEST_DATE : 24_09_03-00_17_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-017-017-04 | FUSED_ID : 6359364768391827732
  IC_TEMP :  -53.28 | VDDM : 1127.66 | AUX_INT :   -6.80 | CsaBias :   58.86
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.18113e-04 / 2
  ADC_P0  : -6.79573e-03 ± 1.93513e-02
  ADC_P1  : 8.25094e-03 ± 4.72768e-04
  ADC_P2  : -5.46519e-06 ± 2.28425e-06
  CSA_Chi2/NDF : 1.06541e-04 / 2
  CSA_P0  : 5.74272e-02 ± 6.88464e-03
  CSA_P1  : 9.69248e-03 ± 5.18708e-04
  CSA_P2  : -4.33391e-05 ± 7.89930e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [57, 62, 70, 76, 111, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [4, 34, 38]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3264', '1.800', '0.1238', '1.800', '0.0979', '7.000', '0.7084', 1, 1, 1, 1, 1725315422.8041267]
VI_after__Init : ['1.201', '0.3264', '1.800', '0.1238', '1.801', '0.0905', '7.000', '0.7076', 1, 1, 1, 1, 1725315430.911468]
VI_at__the_End : ['1.202', '0.4924', '1.800', '0.1370', '1.800', '0.1112', '7.000', '0.7083', 1, 1, 1, 1, 1725315486.4192748]