TEST_NAME : Wafer
TEST_DATE : 24_09_03-00_15_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-017-018-04 | FUSED_ID : 6359364768391827748
  IC_TEMP :  -51.65 | VDDM : 1130.80 | AUX_INT :   -6.72 | CsaBias :   88.03
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.19143e-04 / 2
  ADC_P0  : -6.72053e-03 ± 2.05435e-02
  ADC_P1  : 7.95275e-03 ± 4.88756e-04
  ADC_P2  : -4.76746e-06 ± 2.30113e-06
  CSA_Chi2/NDF : 1.10444e-04 / 2
  CSA_P0  : 5.77418e-02 ± 7.00959e-03
  CSA_P1  : 9.72885e-03 ± 5.28122e-04
  CSA_P2  : -4.21417e-05 ± 8.04267e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [6, 36, 41, 52, 74, 94, 95, 117, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [6, 28, 69, 72, 76, 103, 115, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1946', '1.800', '0.1476', '1.799', '0.0894', '7.000', '0.7075', 1, 1, 1, 1, 1725315326.0734308]
VI_after__Init : ['1.201', '0.1947', '1.800', '0.1472', '1.800', '0.0837', '7.000', '0.7076', 1, 1, 1, 1, 1725315334.12091]
VI_at__the_End : ['1.202', '0.5001', '1.800', '0.1391', '1.800', '0.1093', '7.000', '0.7083', 1, 1, 1, 1, 1725315398.4889154]