TEST_NAME : Wafer
TEST_DATE : 24_09_03-00_12_13
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-017-020-04 | FUSED_ID : 6359364768391827780
  IC_TEMP :  -49.64 | VDDM : 1127.97 | AUX_INT :   -7.52 | CsaBias :   86.70
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.47344e-03 / 2
  ADC_P0  : -7.52127e-03 ± 2.61097e-02
  ADC_P1  : 7.89938e-03 ± 6.25408e-04
  ADC_P2  : -3.97810e-06 ± 2.98575e-06
  CSA_Chi2/NDF : 7.84247e-05 / 2
  CSA_P0  : 5.79684e-02 ± 5.90675e-03
  CSA_P1  : 9.28749e-03 ± 4.45031e-04
  CSA_P2  : -3.71049e-05 ± 6.77730e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [3, 12, 19, 35, 49, 57, 60, 89, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [22, 25, 58, 110, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4696', '1.800', '0.1481', '1.800', '0.0944', '7.000', '0.7074', 1, 1, 1, 1, 1725315133.0484426]
VI_after__Init : ['1.202', '0.4700', '1.800', '0.1480', '1.800', '0.0885', '7.000', '0.7070', 1, 1, 1, 1, 1725315141.7167156]
VI_at__the_End : ['1.202', '0.4927', '1.800', '0.1334', '1.799', '0.1105', '7.000', '0.7084', 1, 1, 1, 1, 1725315203.4699998]