TEST_NAME : Wafer
TEST_DATE : 24_09_03-00_39_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-018-012-13 | FUSED_ID : 6359364768391831757
  IC_TEMP :  -49.97 | VDDM : 1130.47 | AUX_INT :   -7.32 | CsaBias :   81.09
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36696e-03 / 2
  ADC_P0  : -7.31621e-03 ± 2.50896e-02
  ADC_P1  : 8.09300e-03 ± 6.00873e-04
  ADC_P2  : -5.12493e-06 ± 2.85465e-06
  CSA_Chi2/NDF : 1.03777e-04 / 2
  CSA_P0  : 5.67258e-02 ± 6.79476e-03
  CSA_P1  : 9.70128e-03 ± 5.11936e-04
  CSA_P2  : -4.21067e-05 ± 7.79618e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [0, 25, 40, 92, 99, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [5, 29, 38, 60, 61, 80]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3306', '1.800', '0.1300', '1.799', '0.0912', '7.000', '0.7073', 1, 1, 1, 1, 1725316765.7299254]
VI_after__Init : ['1.202', '0.3308', '1.800', '0.1300', '1.800', '0.0863', '7.000', '0.7074', 1, 1, 1, 1, 1725316773.795328]
VI_at__the_End : ['1.202', '0.4973', '1.800', '0.1334', '1.800', '0.1100', '7.000', '0.7082', 1, 1, 1, 1, 1725316841.207105]