TEST_NAME : Wafer
TEST_DATE : 24_09_03-00_45_51
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-018-016-10 | FUSED_ID : 6359364768391831818
  IC_TEMP :  -52.33 | VDDM : 1132.08 | AUX_INT :   -7.65 | CsaBias :   79.86
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.03931e-03 / 2
  ADC_P0  : -7.64917e-03 ± 2.18742e-02
  ADC_P1  : 8.00447e-03 ± 5.25516e-04
  ADC_P2  : -4.47752e-06 ± 2.51279e-06
  CSA_Chi2/NDF : 1.19661e-04 / 2
  CSA_P0  : 5.81442e-02 ± 7.29623e-03
  CSA_P1  : 9.79646e-03 ± 5.49718e-04
  CSA_P2  : -4.38314e-05 ± 8.37156e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [9, 35, 44, 85, 87, 105, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [56, 75, 77]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4789', '1.800', '0.1530', '1.799', '0.1014', '7.000', '0.7079', 1, 1, 1, 1, 1725317151.2063062]
VI_after__Init : ['1.202', '0.4788', '1.800', '0.1530', '1.800', '0.0938', '7.000', '0.7069', 1, 1, 1, 1, 1725317159.248728]
VI_at__the_End : ['1.202', '0.4975', '1.800', '0.1358', '1.800', '0.1109', '7.000', '0.7079', 1, 1, 1, 1, 1725317225.6995819]