TEST_NAME : Wafer
TEST_DATE : 24_09_03-00_52_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-018-018-020-10 | FUSED_ID : 6359364768391831882
  IC_TEMP :  -55.37 | VDDM : 1122.04 | AUX_INT :  -19.84 | CsaBias :   67.01
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.96922e-03 / 2
  ADC_P0  : -1.98440e-02 ± 3.06968e-02
  ADC_P1  : 8.74494e-03 ± 7.72999e-04
  ADC_P2  : -5.99904e-06 ± 3.89509e-06
  CSA_Chi2/NDF : 1.77236e-04 / 2
  CSA_P0  : 6.05580e-02 ± 8.87971e-03
  CSA_P1  : 1.01551e-02 ± 6.69022e-04
  CSA_P2  : -4.94708e-05 ± 1.01884e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [15, 19, 23, 26, 27, 29, 41, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [3, 14, 34, 51, 79, 86, 103, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3473', '1.800', '0.1586', '1.800', '0.0884', '7.000', '0.7069', 1, 1, 1, 1, 1725317537.680701]
VI_after__Init : ['1.202', '0.3477', '1.800', '0.1587', '1.800', '0.0826', '7.000', '0.7067', 1, 1, 1, 1, 1725317545.8560119]
VI_at__the_End : ['1.202', '0.4966', '1.800', '0.1412', '1.808', '0.1125', '7.000', '0.7074', 1, 1, 1, 1, 1725317604.957737]