TEST_NAME : Wafer
TEST_DATE : 24_09_03-08_37_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x5 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-003-019-03 | FUSED_ID : 6359364768392818995
  IC_TEMP :  -55.64 | VDDM : 1128.12 | AUX_INT :   -7.93 | CsaBias :   71.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.03401e-03 / 2
  ADC_P0  : -7.93434e-03 ± 2.17577e-02
  ADC_P1  : 8.04613e-03 ± 5.12267e-04
  ADC_P2  : -5.41704e-06 ± 2.39035e-06
  CSA_Chi2/NDF : 1.21192e-04 / 2
  CSA_P0  : 5.64883e-02 ± 7.34276e-03
  CSA_P1  : 9.56227e-03 ± 5.53224e-04
  CSA_P2  : -4.32201e-05 ± 8.42494e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [49, 51, 65, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [62, 74, 89, 93, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4179', '1.800', '0.1432', '1.800', '0.0940', '7.000', '0.7077', 1, 1, 1, 1, 1725345451.694837]
VI_after__Init : ['1.201', '0.4183', '1.800', '0.1433', '1.800', '0.0865', '7.000', '0.7068', 1, 1, 1, 1, 1725345459.9980443]
VI_at__the_End : ['1.202', '0.4812', '1.800', '0.1312', '1.804', '0.1124', '7.000', '0.7078', 1, 1, 1, 1, 1725345522.7842915]