TEST_NAME : Wafer
TEST_DATE : 24_09_03-09_12_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-004-015-12 | FUSED_ID : 6359364768392823036
  IC_TEMP :  -57.59 | VDDM : 1183.21 | AUX_INT : -562.73 | CsaBias : -369.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.45127e-03 / 2
  ADC_P0  : -5.62726e-01 ± 1.30527e-01
  ADC_P1  : 1.65147e-02 ± 2.61854e-03
  ADC_P2  : -3.43570e-05 ± 1.05410e-05
  CSA_Chi2/NDF : 8.33046e-05 / 2
  CSA_P0  : 5.64594e-02 ± 6.08775e-03
  CSA_P1  : 9.62240e-03 ± 4.58668e-04
  CSA_P2  : -4.17924e-05 ± 6.98497e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [31, 43, 51, 62]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [28, 52, 57, 60, 83, 90]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3103', '1.800', '0.1480', '1.799', '0.0882', '7.000', '0.7076', 1, 1, 1, 1, 1725347558.7114565]
VI_after__Init : ['1.201', '0.3104', '1.800', '0.1480', '1.800', '0.0828', '7.000', '0.7076', 1, 1, 1, 1, 1725347566.6867242]
VI_at__the_End : ['1.201', '0.4945', '1.800', '0.1329', '1.801', '0.1097', '7.000', '0.7083', 1, 1, 1, 1, 1725347628.7029512]