TEST_NAME : Wafer
TEST_DATE : 24_09_03-09_36_36
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-005-019-06 | FUSED_ID : 6359364768392827190
  IC_TEMP :  -59.72 | VDDM : 1118.12 | AUX_INT :   -9.77 | CsaBias :   60.47
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.58591e-03 / 2
  ADC_P0  : -9.77133e-03 ± 2.70207e-02
  ADC_P1  : 8.83011e-03 ± 6.96543e-04
  ADC_P2  : -6.24808e-06 ± 3.58151e-06
  CSA_Chi2/NDF : 1.73053e-04 / 2
  CSA_P0  : 5.98971e-02 ± 8.77428e-03
  CSA_P1  : 1.00588e-02 ± 6.61078e-04
  CSA_P2  : -5.37054e-05 ± 1.00674e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [5, 6, 46, 120, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [21, 61, 83, 94, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.0801', '1.800', '0.1405', '1.799', '0.0808', '7.000', '0.7070', 1, 1, 1, 1, 1725348995.7016819]
VI_after__Init : ['1.202', '0.0801', '1.800', '0.1404', '1.801', '0.0751', '7.000', '0.7070', 1, 1, 1, 1, 1725349003.8700354]
VI_at__the_End : ['1.201', '0.4780', '1.800', '0.1380', '1.807', '0.1142', '7.000', '0.7079', 1, 1, 1, 1, 1725349066.598204]