TEST_NAME : Wafer
TEST_DATE : 24_09_03-09_35_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-005-020-06 | FUSED_ID : 6359364768392827206
  IC_TEMP :  -59.25 | VDDM : 1127.13 | AUX_INT :   -8.35 | CsaBias :   60.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.49944e-03 / 2
  ADC_P0  : -8.35272e-03 ± 2.62838e-02
  ADC_P1  : 8.59949e-03 ± 6.66913e-04
  ADC_P2  : -5.63136e-06 ± 3.37395e-06
  CSA_Chi2/NDF : 1.75767e-04 / 2
  CSA_P0  : 5.98077e-02 ± 8.84283e-03
  CSA_P1  : 1.03537e-02 ± 6.66244e-04
  CSA_P2  : -5.48765e-05 ± 1.01461e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [1, 9, 44, 49, 51, 59, 63, 70, 108, 110, 115, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [36, 42, 70]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4843', '1.800', '0.1372', '1.799', '0.0964', '7.000', '0.7069', 1, 1, 1, 1, 1725348899.513982]
VI_after__Init : ['1.202', '0.4840', '1.800', '0.1374', '1.801', '0.0909', '7.000', '0.7069', 1, 1, 1, 1, 1725348908.3572724]
VI_at__the_End : ['1.202', '0.4858', '1.800', '0.1369', '1.804', '0.1130', '7.000', '0.7081', 1, 1, 1, 1, 1725348967.268674]