TEST_NAME : Wafer
TEST_DATE : 24_09_03-10_03_49
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-006-004-15 | FUSED_ID : 6359364768392831055
  IC_TEMP :  -69.13 | VDDM : 1202.41 | AUX_INT : -853.30 | CsaBias : -619.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.37960e-02 / 2
  ADC_P0  : -8.53298e-01 ± 2.97722e-01
  ADC_P1  : 2.18912e-02 ± 5.90300e-03
  ADC_P2  : -5.37880e-05 ± 2.40295e-05
  CSA_Chi2/NDF : 1.58729e-04 / 2
  CSA_P0  : 5.90476e-02 ± 8.40331e-03
  CSA_P1  : 1.01988e-02 ± 6.33129e-04
  CSA_P2  : -4.99738e-05 ± 9.64180e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [10, 33, 62, 90, 97, 105, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [22, 23, 34, 82, 102, 118, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.200', '0.0999', '1.800', '0.1190', '1.801', '0.0800', '7.000', '0.7076', 1, 1, 1, 1, 1725350628.8454492]
VI_after__Init : ['1.202', '0.0999', '1.800', '0.1190', '1.799', '0.0746', '7.000', '0.7078', 1, 1, 1, 1, 1725350636.971835]
VI_at__the_End : ['1.202', '0.4987', '1.800', '0.1387', '1.805', '0.1130', '7.000', '0.7087', 1, 1, 1, 1, 1725350696.9192324]