TEST_NAME : Wafer
TEST_DATE : 24_09_03-10_35_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-006-024-08 | FUSED_ID : 6359364768392831368
  IC_TEMP :  -54.58 | VDDM : 1138.40 | AUX_INT : -140.49 | CsaBias :  -27.06
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.12175e-04 / 2
  ADC_P0  : -1.40488e-01 ± 2.47793e-02
  ADC_P1  : 1.04526e-02 ± 5.86015e-04
  ADC_P2  : -1.28446e-05 ± 2.72254e-06
  CSA_Chi2/NDF : 1.54545e-04 / 2
  CSA_P0  : 5.87318e-02 ± 8.29182e-03
  CSA_P1  : 1.01332e-02 ± 6.24729e-04
  CSA_P2  : -4.81850e-05 ± 9.51388e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [38, 51, 58, 81, 115, 122, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [10, 76, 92, 94]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2705', '1.800', '0.1605', '1.799', '0.0871', '7.000', '0.7071', 1, 1, 1, 1, 1725352550.0123122]
VI_after__Init : ['1.201', '0.2705', '1.800', '0.1605', '1.801', '0.0820', '7.000', '0.7067', 1, 1, 1, 1, 1725352558.212656]
VI_at__the_End : ['1.202', '0.5000', '1.800', '0.1372', '1.805', '0.1107', '7.000', '0.7075', 1, 1, 1, 1, 1725352619.8809385]