TEST_NAME : Wafer
TEST_DATE : 24_09_03-10_37_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-006-025-08 | FUSED_ID : 6359364768392831384
  IC_TEMP :  -49.76 | VDDM : 1127.28 | AUX_INT :   -8.72 | CsaBias :   76.23
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17080e-03 / 2
  ADC_P0  : -8.71907e-03 ± 2.31469e-02
  ADC_P1  : 8.55766e-03 ± 5.74856e-04
  ADC_P2  : -6.26533e-06 ± 2.83671e-06
  CSA_Chi2/NDF : 1.91694e-04 / 2
  CSA_P0  : 5.76343e-02 ± 9.23478e-03
  CSA_P1  : 1.02325e-02 ± 6.95774e-04
  CSA_P2  : -4.86615e-05 ± 1.05958e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [39, 114, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [37, 45, 59, 103, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4255', '1.800', '0.1408', '1.800', '0.0943', '7.000', '0.7069', 1, 1, 1, 1, 1725352645.7100186]
VI_after__Init : ['1.201', '0.4257', '1.800', '0.1408', '1.799', '0.0884', '7.000', '0.7070', 1, 1, 1, 1, 1725352653.8763855]
VI_at__the_End : ['1.201', '0.5042', '1.800', '0.1371', '1.804', '0.1095', '7.000', '0.7078', 1, 1, 1, 1, 1725352713.1628256]