TEST_NAME : Wafer
TEST_DATE : 24_09_03-11_36_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-008-013-06 | FUSED_ID : 6359364768392839382
  IC_TEMP :  -51.88 | VDDM : 1123.20 | AUX_INT :   -8.39 | CsaBias :   76.43
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26642e-03 / 2
  ADC_P0  : -8.38608e-03 ± 2.41293e-02
  ADC_P1  : 8.53867e-03 ± 6.08045e-04
  ADC_P2  : -5.71988e-06 ± 3.04371e-06
  CSA_Chi2/NDF : 1.30444e-04 / 2
  CSA_P0  : 5.91869e-02 ± 7.61788e-03
  CSA_P1  : 1.03734e-02 ± 5.73952e-04
  CSA_P2  : -5.43110e-05 ± 8.74061e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [0, 19, 26, 27, 31, 41, 53]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [28, 47, 80, 100, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3098', '1.800', '0.1558', '1.800', '0.0901', '7.000', '0.7082', 1, 1, 1, 1, 1725356211.579942]
VI_after__Init : ['1.201', '0.3098', '1.800', '0.1555', '1.799', '0.0830', '7.000', '0.7074', 1, 1, 1, 1, 1725356220.276285]
VI_at__the_End : ['1.202', '0.4931', '1.800', '0.1374', '1.799', '0.1108', '7.000', '0.7079', 1, 1, 1, 1, 1725356279.5637689]