TEST_NAME : Wafer
TEST_DATE : 24_09_03-11_43_17
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-008-017-01 | FUSED_ID : 6359364768392839441
  IC_TEMP :  -32.09 | VDDM :  853.69 | AUX_INT : -899.32 | CsaBias : 1018.97
  CONF_FAIL_REG : 1720
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13273e+00 / 2
  ADC_P0  : -8.99316e-01 ± 3.79627e+00
  ADC_P1  : 2.04160e-02 ± 5.33658e-02
  ADC_P2  : -5.31037e-05 ± 1.53267e-04
  CSA_Chi2/NDF : 1.08956e-03 / 2
  CSA_P0  : 1.07293e-01 ± 2.20165e-02
  CSA_P1  : 6.57385e-03 ± 1.65878e-03
  CSA_P2  : -4.15472e-05 ± 2.52613e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [0, 1, 11, 94, 103, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [8, 10, 17, 21, 32, 41, 74, 89, 95]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2083', '1.800', '0.1896', '1.797', '0.1502', '7.000', '0.7074', 1, 1, 1, 1, 1725356597.0353715]
VI_after__Init : ['1.202', '0.2084', '1.800', '0.1912', '1.799', '0.1500', '7.000', '0.7075', 1, 1, 1, 1, 1725356605.097763]
VI_at__the_End : ['1.202', '0.3442', '1.800', '0.1501', '1.803', '0.1376', '7.000', '0.7083', 1, 1, 1, 1, 1725356663.3610668]