TEST_NAME : Wafer
TEST_DATE : 24_09_03-11_46_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-008-019-01 | FUSED_ID : 6359364768392839473
  IC_TEMP :  -52.21 | VDDM : 1133.26 | AUX_INT :   -7.40 | CsaBias :   76.75
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.04384e-03 / 2
  ADC_P0  : -7.39830e-03 ± 2.18827e-02
  ADC_P1  : 8.47289e-03 ± 5.47683e-04
  ADC_P2  : -5.78981e-06 ± 2.71299e-06
  CSA_Chi2/NDF : 1.14719e-04 / 2
  CSA_P0  : 6.10490e-02 ± 7.14397e-03
  CSA_P1  : 9.93939e-03 ± 5.38246e-04
  CSA_P2  : -4.59430e-05 ± 8.19686e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [6, 13, 15, 16, 55, 68, 105, 117, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [43, 51, 56, 68, 71, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2988', '1.800', '0.1379', '1.799', '0.0889', '7.000', '0.7084', 1, 1, 1, 1, 1725356789.2262907]
VI_after__Init : ['1.201', '0.2989', '1.800', '0.1378', '1.800', '0.0815', '7.000', '0.7076', 1, 1, 1, 1, 1725356797.2866485]
VI_at__the_End : ['1.201', '0.4986', '1.800', '0.1394', '1.804', '0.1111', '7.000', '0.7086', 1, 1, 1, 1, 1725356863.7004423]