TEST_NAME : Wafer
TEST_DATE : 24_09_03-11_52_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-008-023-01 | FUSED_ID : 6359364768392839537
  IC_TEMP :  -48.92 | VDDM : 1125.30 | AUX_INT :  -46.36 | CsaBias :   50.53
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.09336e-03 / 2
  ADC_P0  : -4.63570e-02 ± 3.33782e-02
  ADC_P1  : 8.88982e-03 ± 8.02769e-04
  ADC_P2  : -7.48693e-06 ± 3.82634e-06
  CSA_Chi2/NDF : 1.47762e-04 / 2
  CSA_P0  : 5.77659e-02 ± 8.10780e-03
  CSA_P1  : 9.98855e-03 ± 6.10864e-04
  CSA_P2  : -4.78894e-05 ± 9.30274e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [2, 13, 42, 48, 78]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [14, 29, 39, 52, 70, 77, 89, 102, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1036', '1.800', '0.1300', '1.800', '0.0816', '7.000', '0.7079', 1, 1, 1, 1, 1725357175.4051561]
VI_after__Init : ['1.202', '0.1036', '1.800', '0.1299', '1.800', '0.0758', '7.000', '0.7079', 1, 1, 1, 1, 1725357183.498518]
VI_at__the_End : ['1.202', '0.4927', '1.800', '0.1387', '1.800', '0.1116', '7.000', '0.7085', 1, 1, 1, 1, 1725357250.4354007]