TEST_NAME : Wafer
TEST_DATE : 24_09_03-11_54_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-008-024-01 | FUSED_ID : 6359364768392839553
  IC_TEMP :  -60.73 | VDDM : 1212.85 | AUX_INT : -880.14 | CsaBias : -626.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 3.92261e-02 / 2
  ADC_P0  : -8.80139e-01 ± 4.03493e-01
  ADC_P1  : 2.17507e-02 ± 7.78925e-03
  ADC_P2  : -5.25069e-05 ± 3.09023e-05
  CSA_Chi2/NDF : 1.31671e-04 / 2
  CSA_P0  : 5.81771e-02 ± 7.65362e-03
  CSA_P1  : 9.87251e-03 ± 5.76645e-04
  CSA_P2  : -4.46730e-05 ± 8.78162e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [0, 7, 28, 35, 37, 47, 57, 96]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [0, 3, 23, 57, 67, 99, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1954', '1.800', '0.1457', '1.799', '0.0816', '7.000', '0.7077', 1, 1, 1, 1, 1725357271.4506805]
VI_after__Init : ['1.202', '0.1954', '1.800', '0.1456', '1.801', '0.0761', '7.000', '0.7080', 1, 1, 1, 1, 1725357280.3859768]
VI_at__the_End : ['1.202', '0.5001', '1.800', '0.1366', '1.806', '0.1100', '7.000', '0.7086', 1, 1, 1, 1, 1725357338.8665648]