TEST_NAME : Wafer
TEST_DATE : 24_09_03-11_59_20
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-008-027-01 | FUSED_ID : 6359364768392839601
  IC_TEMP :  -48.24 | VDDM : 1127.86 | AUX_INT :  -93.80 | CsaBias :   11.68
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.11518e-03 / 2
  ADC_P0  : -9.37964e-02 ± 2.67707e-02
  ADC_P1  : 9.70352e-03 ± 6.41972e-04
  ADC_P2  : -1.03941e-05 ± 3.01331e-06
  CSA_Chi2/NDF : 9.29421e-05 / 2
  CSA_P0  : 5.68443e-02 ± 6.43026e-03
  CSA_P1  : 9.30585e-03 ± 4.84474e-04
  CSA_P2  : -3.84551e-05 ± 7.37796e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [5, 99, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [32, 57, 68, 74, 100, 104, 108, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2198', '1.800', '0.1542', '1.799', '0.0910', '7.000', '0.7073', 1, 1, 1, 1, 1725357560.683413]
VI_after__Init : ['1.202', '0.2196', '1.800', '0.1542', '1.800', '0.0855', '7.000', '0.7074', 1, 1, 1, 1, 1725357568.8207817]
VI_at__the_End : ['1.202', '0.4871', '1.800', '0.1317', '1.801', '0.1100', '7.000', '0.7082', 1, 1, 1, 1, 1725357628.7451553]