TEST_NAME : Wafer
TEST_DATE : 24_09_03-12_41_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-009-002-11 | FUSED_ID : 6359364768392843307
  IC_TEMP :  -53.90 | VDDM : 1110.38 | AUX_INT :   -6.65 | CsaBias :   76.58
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.90798e-04 / 2
  ADC_P0  : -6.64895e-03 ± 1.90379e-02
  ADC_P1  : 8.37606e-03 ± 4.76445e-04
  ADC_P2  : -5.28713e-06 ± 2.36244e-06
  CSA_Chi2/NDF : 1.85037e-04 / 2
  CSA_P0  : 5.79336e-02 ± 9.07302e-03
  CSA_P1  : 1.03022e-02 ± 6.83587e-04
  CSA_P2  : -5.12659e-05 ± 1.04102e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [4, 8, 14, 60, 72, 77, 106, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [0, 56, 59, 74, 85, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4448', '1.800', '0.1702', '1.800', '0.0927', '7.000', '0.7077', 1, 1, 1, 1, 1725360066.789096]
VI_after__Init : ['1.201', '0.4454', '1.800', '0.1703', '1.800', '0.0866', '7.000', '0.7076', 1, 1, 1, 1, 1725360074.9294634]
VI_at__the_End : ['1.201', '0.4987', '1.800', '0.1391', '1.801', '0.1111', '7.000', '0.7086', 1, 1, 1, 1, 1725360143.2691605]