TEST_NAME : Wafer
TEST_DATE : 24_09_03-12_39_31
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-009-003-11 | FUSED_ID : 6359364768392843323
  IC_TEMP :  -52.27 | VDDM : 1122.88 | AUX_INT :   -8.20 | CsaBias :   73.11
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.15805e-03 / 2
  ADC_P0  : -8.19603e-03 ± 2.30814e-02
  ADC_P1  : 8.17925e-03 ± 5.62868e-04
  ADC_P2  : -4.85498e-06 ± 2.73304e-06
  CSA_Chi2/NDF : 1.71557e-04 / 2
  CSA_P0  : 5.63986e-02 ± 8.73628e-03
  CSA_P1  : 1.02639e-02 ± 6.58216e-04
  CSA_P2  : -5.11532e-05 ± 1.00238e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [6, 11, 19, 37, 51, 70, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [51, 55, 63, 70, 76, 100]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2110', '1.800', '0.1437', '1.800', '0.0852', '7.000', '0.7083', 1, 1, 1, 1, 1725359970.4466705]
VI_after__Init : ['1.202', '0.2110', '1.800', '0.1436', '1.800', '0.0779', '7.000', '0.7077', 1, 1, 1, 1, 1725359979.3750389]
VI_at__the_End : ['1.201', '0.4960', '1.800', '0.1381', '1.800', '0.1113', '7.000', '0.7084', 1, 1, 1, 1, 1725360047.5425992]