TEST_NAME : Wafer
TEST_DATE : 24_09_03-12_36_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-009-005-11 | FUSED_ID : 6359364768392843355
  IC_TEMP :  -61.04 | VDDM : 1148.33 | AUX_INT : -263.75 | CsaBias : -129.44
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 5.13993e-04 / 2
  ADC_P0  : -2.63746e-01 ± 2.39238e-02
  ADC_P1  : 1.24312e-02 ± 5.41874e-04
  ADC_P2  : -2.01160e-05 ± 2.41770e-06
  CSA_Chi2/NDF : 1.75749e-04 / 2
  CSA_P0  : 6.07675e-02 ± 8.84237e-03
  CSA_P1  : 1.02965e-02 ± 6.66209e-04
  CSA_P2  : -5.25991e-05 ± 1.01456e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [7, 80, 91, 95, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [2, 18, 26, 45, 68, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2289', '1.800', '0.1520', '1.799', '0.0913', '7.000', '0.7077', 1, 1, 1, 1, 1725359777.5637517]
VI_after__Init : ['1.202', '0.2289', '1.800', '0.1520', '1.800', '0.0855', '6.999', '0.7075', 1, 1, 1, 1, 1725359786.374088]
VI_at__the_End : ['1.201', '0.4964', '1.800', '0.1408', '1.800', '0.1120', '7.000', '0.7082', 1, 1, 1, 1, 1725359854.7146895]