TEST_NAME : Wafer
TEST_DATE : 24_09_03-12_23_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-009-013-11 | FUSED_ID : 6359364768392843483
  IC_TEMP :  -48.17 | VDDM : 1132.69 | AUX_INT :   -8.18 | CsaBias :   81.39
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18578e-03 / 2
  ADC_P0  : -8.18148e-03 ± 2.33490e-02
  ADC_P1  : 8.19964e-03 ± 5.67529e-04
  ADC_P2  : -5.13880e-06 ± 2.74034e-06
  CSA_Chi2/NDF : 1.23415e-04 / 2
  CSA_P0  : 5.77891e-02 ± 7.40981e-03
  CSA_P1  : 1.02534e-02 ± 5.58276e-04
  CSA_P2  : -5.02494e-05 ± 8.50188e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [24, 63, 83, 112, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [11, 36, 54, 58, 73, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4171', '1.800', '0.1470', '1.800', '0.0902', '7.000', '0.7068', 1, 1, 1, 1, 1725359006.267893]
VI_after__Init : ['1.202', '0.4173', '1.800', '0.1470', '1.801', '0.0845', '7.000', '0.7068', 1, 1, 1, 1, 1725359014.4402304]
VI_at__the_End : ['1.201', '0.5004', '1.800', '0.1369', '1.799', '0.1104', '7.000', '0.7079', 1, 1, 1, 1, 1725359083.2606351]