TEST_NAME : Wafer
TEST_DATE : 24_09_03-12_07_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-009-023-12 | FUSED_ID : 6359364768392843644
  IC_TEMP :  -51.32 | VDDM : 1128.92 | AUX_INT :   -6.88 | CsaBias :   66.96
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09806e-03 / 2
  ADC_P0  : -6.87587e-03 ± 2.25107e-02
  ADC_P1  : 8.24392e-03 ± 5.64675e-04
  ADC_P2  : -4.47953e-06 ± 2.80837e-06
  CSA_Chi2/NDF : 1.05245e-04 / 2
  CSA_P0  : 6.10451e-02 ± 6.84264e-03
  CSA_P1  : 9.77315e-03 ± 5.15544e-04
  CSA_P2  : -4.38047e-05 ± 7.85112e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [51]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [11, 47, 54, 74, 76, 91, 125, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4517', '1.800', '0.1617', '1.800', '0.0922', '7.000', '0.7071', 1, 1, 1, 1, 1725358042.4005923]
VI_after__Init : ['1.201', '0.4522', '1.800', '0.1618', '1.800', '0.0863', '7.000', '0.7069', 1, 1, 1, 1, 1725358051.2349267]
VI_at__the_End : ['1.201', '0.4963', '1.800', '0.1373', '1.803', '0.1107', '7.000', '0.7078', 1, 1, 1, 1, 1725358115.016954]