TEST_NAME : Wafer
TEST_DATE : 24_09_03-12_05_47
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-009-024-12 | FUSED_ID : 6359364768392843660
  IC_TEMP :  -50.40 | VDDM : 1127.01 | AUX_INT :   -8.33 | CsaBias :   73.19
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05474e-03 / 2
  ADC_P0  : -8.32869e-03 ± 2.19791e-02
  ADC_P1  : 8.20641e-03 ± 5.28459e-04
  ADC_P2  : -5.41590e-06 ± 2.53057e-06
  CSA_Chi2/NDF : 1.21770e-04 / 2
  CSA_P0  : 5.90691e-02 ± 7.36025e-03
  CSA_P1  : 9.99998e-03 ± 5.54542e-04
  CSA_P2  : -4.60799e-05 ± 8.44501e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [14, 26, 81, 112, 122, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [45, 70, 82, 93, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2280', '1.800', '0.1454', '1.800', '0.0823', '7.000', '0.7072', 1, 1, 1, 1, 1725357946.9848297]
VI_after__Init : ['1.202', '0.2281', '1.800', '0.1454', '1.800', '0.0769', '7.000', '0.7071', 1, 1, 1, 1, 1725357954.985254]
VI_at__the_End : ['1.201', '0.5035', '1.800', '0.1383', '1.801', '0.1106', '7.000', '0.7078', 1, 1, 1, 1, 1725358023.6859903]