TEST_NAME : Wafer
TEST_DATE : 24_09_03-12_00_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-009-027-12 | FUSED_ID : 6359364768392843708
  IC_TEMP :  -49.12 | VDDM : 1128.13 | AUX_INT :   -8.56 | CsaBias :   81.63
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.61928e-03 / 2
  ADC_P0  : -8.55634e-03 ± 2.73658e-02
  ADC_P1  : 8.25106e-03 ± 6.76933e-04
  ADC_P2  : -4.79036e-06 ± 3.32990e-06
  CSA_Chi2/NDF : 7.74664e-05 / 2
  CSA_P0  : 5.62818e-02 ± 5.87055e-03
  CSA_P1  : 9.31193e-03 ± 4.42304e-04
  CSA_P2  : -3.83830e-05 ± 6.73577e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [11, 54, 56, 86, 89, 99, 112, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [102, 104, 122, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1275', '1.800', '0.1412', '1.800', '0.0855', '7.000', '0.7076', 1, 1, 1, 1, 1725357656.607089]
VI_after__Init : ['1.201', '0.1275', '1.800', '0.1412', '1.801', '0.0803', '7.000', '0.7073', 1, 1, 1, 1, 1725357665.4394631]
VI_at__the_End : ['1.202', '0.4867', '1.800', '0.1345', '1.804', '0.1108', '7.000', '0.7082', 1, 1, 1, 1, 1725357733.144247]