TEST_NAME : Wafer
TEST_DATE : 24_09_03-13_03_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x3 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-010-015-05 | FUSED_ID : 6359364768392847605
  IC_TEMP :  -58.97 | VDDM : 1133.72 | AUX_INT :   -7.67 | CsaBias :   62.43
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.60332e-04 / 2
  ADC_P0  : -7.67489e-03 ± 1.97851e-02
  ADC_P1  : 8.81992e-03 ± 5.01667e-04
  ADC_P2  : -7.17895e-06 ± 2.51677e-06
  CSA_Chi2/NDF : 1.43315e-04 / 2
  CSA_P0  : 5.93543e-02 ± 7.98488e-03
  CSA_P1  : 1.00155e-02 ± 6.01603e-04
  CSA_P2  : -5.03698e-05 ± 9.16170e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [59, 66, 72, 83, 92, 113, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [7, 11, 24, 38, 50, 85, 91, 99, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3505', '1.800', '0.1809', '1.800', '0.0347', '7.000', '0.7052', 1, 1, 1, 1, 1725361413.8391192]
VI_after__Init : ['1.201', '0.3501', '1.800', '0.1808', '1.800', '0.0887', '7.000', '0.7069', 1, 1, 1, 1, 1725361421.87151]
VI_at__the_End : ['1.201', '0.4861', '1.800', '0.1391', '1.799', '0.1127', '7.000', '0.7076', 1, 1, 1, 1, 1725361490.0043495]