TEST_NAME : Wafer
TEST_DATE : 24_09_03-13_42_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-011-016-15 | FUSED_ID : 6359364768392851727
  IC_TEMP :  -51.42 | VDDM : 1131.66 | AUX_INT :   -6.97 | CsaBias :   75.45
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.02998e-03 / 2
  ADC_P0  : -6.96607e-03 ± 2.17392e-02
  ADC_P1  : 8.29720e-03 ± 5.34029e-04
  ADC_P2  : -5.58962e-06 ± 2.58965e-06
  CSA_Chi2/NDF : 1.00916e-04 / 2
  CSA_P0  : 6.04105e-02 ± 6.70044e-03
  CSA_P1  : 9.67592e-03 ± 5.04830e-04
  CSA_P2  : -4.23970e-05 ± 7.68796e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [42, 51, 72, 74, 95, 116, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [34, 54, 65, 73, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2094', '1.800', '0.1450', '1.799', '0.0915', '7.000', '0.7072', 1, 1, 1, 1, 1725363726.6709263]
VI_after__Init : ['1.202', '0.2095', '1.800', '0.1450', '1.800', '0.0859', '6.999', '0.7073', 1, 1, 1, 1, 1725363735.4181914]
VI_at__the_End : ['1.201', '0.4983', '1.800', '0.1368', '1.799', '0.1099', '7.000', '0.7079', 1, 1, 1, 1, 1725363794.5746706]