TEST_NAME : Wafer
TEST_DATE : 24_09_03-13_40_31
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-011-017-15 | FUSED_ID : 6359364768392851743
  IC_TEMP :  -49.84 | VDDM : 1125.36 | AUX_INT :   -7.11 | CsaBias :   68.38
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.70114e-04 / 2
  ADC_P0  : -7.10815e-03 ± 1.99481e-02
  ADC_P1  : 8.44064e-03 ± 4.94822e-04
  ADC_P2  : -5.93919e-06 ± 2.42821e-06
  CSA_Chi2/NDF : 1.12772e-04 / 2
  CSA_P0  : 6.13894e-02 ± 7.08309e-03
  CSA_P1  : 1.00163e-02 ± 5.33660e-04
  CSA_P2  : -4.77609e-05 ± 8.12701e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [46, 63, 67, 90, 104, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [58, 61, 81, 100]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3378', '1.800', '0.1466', '1.800', '0.0832', '7.000', '0.7076', 1, 1, 1, 1, 1725363630.583284]
VI_after__Init : ['1.202', '0.3379', '1.800', '0.1467', '1.800', '0.0778', '7.000', '0.7072', 1, 1, 1, 1, 1725363639.2455747]
VI_at__the_End : ['1.201', '0.4976', '1.800', '0.1415', '1.801', '0.1114', '7.000', '0.7082', 1, 1, 1, 1, 1725363707.2134771]