TEST_NAME : Wafer
TEST_DATE : 24_09_03-13_37_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-011-019-15 | FUSED_ID : 6359364768392851775
  IC_TEMP :  -50.86 | VDDM : 1116.56 | AUX_INT :   -7.35 | CsaBias :   83.45
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18891e-03 / 2
  ADC_P0  : -7.35323e-03 ± 2.33988e-02
  ADC_P1  : 8.31163e-03 ± 5.81796e-04
  ADC_P2  : -5.15816e-06 ± 2.86366e-06
  CSA_Chi2/NDF : 9.21812e-05 / 2
  CSA_P0  : 5.95053e-02 ± 6.40388e-03
  CSA_P1  : 9.68745e-03 ± 4.82486e-04
  CSA_P2  : -4.29407e-05 ± 7.34770e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [11, 12, 47, 82, 103, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [10, 47, 76, 87, 99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2180', '1.800', '0.1508', '1.799', '0.0834', '7.000', '0.7075', 1, 1, 1, 1, 1725363438.434074]
VI_after__Init : ['1.202', '0.2180', '1.800', '0.1508', '1.799', '0.0777', '7.000', '0.7073', 1, 1, 1, 1, 1725363446.5384443]
VI_at__the_End : ['1.201', '0.4962', '1.800', '0.1368', '1.801', '0.1110', '7.000', '0.7086', 1, 1, 1, 1, 1725363515.5850372]