TEST_NAME : Wafer
TEST_DATE : 24_09_03-13_32_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-011-022-15 | FUSED_ID : 6359364768392851823
  IC_TEMP :  -52.08 | VDDM : 1128.86 | AUX_INT :   -7.08 | CsaBias :   75.20
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.85580e-04 / 2
  ADC_P0  : -7.07991e-03 ± 2.12720e-02
  ADC_P1  : 8.28134e-03 ± 5.24271e-04
  ADC_P2  : -5.31624e-06 ± 2.55660e-06
  CSA_Chi2/NDF : 8.94338e-05 / 2
  CSA_P0  : 5.87584e-02 ± 6.30773e-03
  CSA_P1  : 9.41089e-03 ± 4.75242e-04
  CSA_P2  : -3.99872e-05 ± 7.23737e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [9, 39, 46, 55, 76, 97]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [52, 63, 86, 94, 115, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3526', '1.800', '0.1799', '1.799', '0.0903', '7.000', '0.7078', 1, 1, 1, 1, 1725363148.4732199]
VI_after__Init : ['1.202', '0.3526', '1.800', '0.1800', '1.801', '0.0849', '7.000', '0.7077', 1, 1, 1, 1, 1725363157.4575634]
VI_at__the_End : ['1.202', '0.4875', '1.800', '0.1601', '1.800', '0.1126', '7.000', '0.7086', 1, 1, 1, 1, 1725363218.3869333]