TEST_NAME : Wafer
TEST_DATE : 24_09_03-13_30_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-011-023-15 | FUSED_ID : 6359364768392851839
  IC_TEMP :  -50.71 | VDDM : 1126.12 | AUX_INT :   -9.13 | CsaBias :   71.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43992e-03 / 2
  ADC_P0  : -9.13158e-03 ± 2.57394e-02
  ADC_P1  : 8.13452e-03 ± 6.15157e-04
  ADC_P2  : -5.22773e-06 ± 2.92524e-06
  CSA_Chi2/NDF : 1.22901e-04 / 2
  CSA_P0  : 6.07295e-02 ± 7.39434e-03
  CSA_P1  : 1.01716e-02 ± 5.57110e-04
  CSA_P2  : -4.93365e-05 ± 8.48412e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [30, 62, 80, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [2, 14, 51, 63, 90, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2775', '1.800', '0.1356', '1.800', '0.0915', '7.000', '0.7074', 1, 1, 1, 1, 1725363051.55676]
VI_after__Init : ['1.202', '0.2774', '1.800', '0.1349', '1.800', '0.0860', '7.000', '0.7076', 1, 1, 1, 1, 1725363060.406073]
VI_at__the_End : ['1.202', '0.4994', '1.800', '0.1364', '1.803', '0.1109', '6.999', '0.7086', 1, 1, 1, 1, 1725363128.2528336]