TEST_NAME : Wafer
TEST_DATE : 24_09_03-13_29_16
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-011-024-15 | FUSED_ID : 6359364768392851855
  IC_TEMP :  -51.90 | VDDM : 1126.61 | AUX_INT :   -7.43 | CsaBias :   75.11
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.97250e-04 / 2
  ADC_P0  : -7.43452e-03 ± 2.13814e-02
  ADC_P1  : 8.31088e-03 ± 5.24129e-04
  ADC_P2  : -5.59260e-06 ± 2.54410e-06
  CSA_Chi2/NDF : 1.54684e-04 / 2
  CSA_P0  : 5.89261e-02 ± 8.29554e-03
  CSA_P1  : 1.02112e-02 ± 6.25009e-04
  CSA_P2  : -4.98498e-05 ± 9.51815e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [0, 6, 19, 36, 37, 38, 55]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [4, 6, 14, 19, 21, 27, 59]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2646', '1.800', '0.1591', '1.800', '0.0878', '7.000', '0.7076', 1, 1, 1, 1, 1725362955.7899761]
VI_after__Init : ['1.202', '0.2645', '1.800', '0.1590', '1.800', '0.0822', '7.000', '0.7076', 1, 1, 1, 1, 1725362963.9444065]
VI_at__the_End : ['1.202', '0.4981', '1.800', '0.1359', '1.805', '0.1104', '7.000', '0.7083', 1, 1, 1, 1, 1725363024.9687684]