TEST_NAME : Wafer
TEST_DATE : 24_09_03-13_24_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-011-027-15 | FUSED_ID : 6359364768392851903
  IC_TEMP :  -53.22 | VDDM : 1129.56 | AUX_INT :   -8.37 | CsaBias :   74.68
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10097e-03 / 2
  ADC_P0  : -8.37016e-03 ± 2.24558e-02
  ADC_P1  : 8.36294e-03 ± 5.49267e-04
  ADC_P2  : -5.76690e-06 ± 2.66856e-06
  CSA_Chi2/NDF : 1.06443e-04 / 2
  CSA_P0  : 5.76723e-02 ± 6.88147e-03
  CSA_P1  : 9.59502e-03 ± 5.18469e-04
  CSA_P2  : -4.18071e-05 ± 7.89567e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [5, 23, 35, 38, 44, 45, 48, 51, 71, 119, 121, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [0, 23, 47, 60, 68, 86]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2599', '1.800', '0.1050', '1.799', '0.0843', '7.000', '0.7075', 1, 1, 1, 1, 1725362665.9581652]
VI_after__Init : ['1.201', '0.2600', '1.800', '0.1050', '1.800', '0.0790', '7.000', '0.7076', 1, 1, 1, 1, 1725362674.0425339]
VI_at__the_End : ['1.202', '0.4932', '1.800', '0.1311', '1.806', '0.1115', '7.000', '0.7082', 1, 1, 1, 1, 1725362742.7022316]