TEST_NAME : Wafer
TEST_DATE : 24_09_03-14_07_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-012-003-00 | FUSED_ID : 6359364768392855600
  IC_TEMP :  -52.76 | VDDM : 1132.75 | AUX_INT :   -7.19 | CsaBias :   74.95
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.52267e-04 / 2
  ADC_P0  : -7.19171e-03 ± 2.09159e-02
  ADC_P1  : 8.26496e-03 ± 5.17211e-04
  ADC_P2  : -5.03499e-06 ± 2.53643e-06
  CSA_Chi2/NDF : 1.30023e-04 / 2
  CSA_P0  : 6.03568e-02 ± 7.60558e-03
  CSA_P1  : 9.81293e-03 ± 5.73026e-04
  CSA_P2  : -4.36304e-05 ± 8.72650e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [18, 83, 87]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [2, 58, 61, 74, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1159', '1.800', '0.1178', '1.800', '0.0846', '7.000', '0.7072', 1, 1, 1, 1, 1725365261.9352145]
VI_after__Init : ['1.202', '0.1158', '1.800', '0.1178', '1.800', '0.0790', '7.000', '0.7072', 1, 1, 1, 1, 1725365269.9426503]
VI_at__the_End : ['1.201', '0.5013', '1.800', '0.1411', '1.800', '0.1098', '7.000', '0.7082', 1, 1, 1, 1, 1725365335.9455123]