TEST_NAME : Wafer
TEST_DATE : 24_09_03-14_22_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-019-012-012-00 | FUSED_ID : 6359364768392855744
  IC_TEMP :  -47.21 | VDDM : 1119.60 | AUX_INT :   -9.13 | CsaBias :   79.72
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43992e-03 / 2
  ADC_P0  : -9.13158e-03 ± 2.57394e-02
  ADC_P1  : 8.13452e-03 ± 6.15157e-04
  ADC_P2  : -5.22773e-06 ± 2.92524e-06
  CSA_Chi2/NDF : 6.11220e-05 / 2
  CSA_P0  : 6.11857e-02 ± 5.21460e-03
  CSA_P1  : 9.23301e-03 ± 3.92883e-04
  CSA_P2  : -3.61152e-05 ± 5.98314e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [12, 34, 64, 67, 107, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [23, 49, 51, 95, 101, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3842', '1.800', '0.1529', '1.800', '0.0909', '7.000', '0.7079', 1, 1, 1, 1, 1725366126.5028284]
VI_after__Init : ['1.201', '0.3844', '1.800', '0.1528', '1.799', '0.0852', '7.000', '0.7079', 1, 1, 1, 1, 1725366135.2131913]
VI_at__the_End : ['1.202', '0.4967', '1.800', '0.1380', '1.799', '0.1088', '7.000', '0.7086', 1, 1, 1, 1, 1725366195.568519]